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MICROSCOPE A AUTODESORPTIONNIKONENKOV NV; KHLYNTSEV VP; POTAPOV LP et al.1980; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1980; NO 3; PP. 221-223; BIBL. 6 REF.Article

PROCEDE D'ETUDE DE LA SOUFFLURE RADIATIVE DANS UN MICROSCOPE IONIQUE A EMISSION CHAMPDRANOVA ZH I; MIKHAJLOVSKIJ IM; SUVOROV AL et al.1980; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1980; NO 3; PP. 225-228; BIBL. 8 REF.Article

A COMPUTATIONAL CRITIQUE OF AN ALGORITHM FOR IMAGE ENHANCEMENT IN BRIGHT FIELD ELECTRON MICROSCOPYWELTON TA.1979; ADV. ELECTRON. ELECTRON PHYS.; USA; DA. 1979; VOL. 48; PP. 37-101; BIBL. 40 REF.Article

LORENTZ ELECTRON MICROSCOPE OBSERVATIONS OF MAGNETIC DOMAINS WITH A FIELD EMISSION GUN.INOUE M; HARADA Y; YAMAMOTO T et al.1977; OPTIK; DTSCH.; DA. 1977; VOL. 48; NO 3; PP. 341-343; ABS. ALLEM.; BIBL. 6 REF.Article

ION TRAJECTORIES IN THE FIELD-ION MICROSCOPE.SMITH R; WALLS JM.1978; J. PHYS. D; G.B.; DA. 1978; VOL. 11; NO 4; PP. 409-419; BIBL. 16 REF.Article

RING COUNTING IN FIELD-ION MICROGRAPHSWEBBER RD; WALLS JM; SMITH R et al.1978; J. MICR.; GBR; DA. 1978; VOL. 113; NO 3; PP. 291-299; BIBL. 10 REF.Article

SURFACE SHAPE CHANGES OF TUNGSTEN EMITTER STUDIED BY THE FIELD ION MICROSCOPY.NISKIGAKI S; NAKAMURA S; KURODA T et al.1978; JAP. J. APPL. PHYS.; JAP.; DA. 1978; VOL. 17; NO 1; PP. 79-83; BIBL. 15 REF.Article

A GNOMONIC METHOD FOR THE INDEXING OF FIELD ION MICROGRAPHS.HENSLEE SP; MARGOLIS WS; JOHNSON RM et al.1978; J. APPL. PHYS.; USA; DA. 1978; VOL. 49; NO 8; PP. 4574-4576; BIBL. 5 REF.Article

ARGON FIELD ION MICROSCOPY OF ZINC OXIDE EMITTERS ORIENTED (0001) AND (0001)MARIEN J.1978; BULL. SOC. R. SCI. LIEGE; BEL; DA. 1978; VOL. 47; NO 9-10; PP. 237-248; BIBL. 19 REF.Article

FIELD CALIBRATION USING THE ENERGY DISTRIBUTION OF A FREE-SPACE FIELD IONIZATION.SAKURAI T; MULLER EW.1977; J. APPL. PHYS.; U.S.A.; DA. 1977; VOL. 48; NO 6; PP. 2618-2625; BIBL. 20 REF.Article

GENERATEUR D'IMPULSIONS D'EVAPORATION D'UNE SONDE ATOMIQUENIKONENKOV NV; LEBEDEV VB.1977; PRIBORY TEKH. EKSPER.; S.S.S.R.; DA. 1977; NO 3; PP. 97-98; BIBL. 4 REF.Article

PERFORMANCE OF A FIELD EMISSION GUN SCANNING ELECTRON MICROSCOPE COLUMNVENABLES JA; JANSSEN AP.1980; ULTRAMICROSCOPY; NLD; DA. 1980; VOL. 5; NO 3; PP. 297-315; BIBL. 31 REF.Article

OBSERVATION OF ATOM IMAGES BY MEANS OF FIELD EMISSION STEM.TODOKORO H; NOMURA S; KOMODA T et al.1977; J. ELECTRON. MICR.; JAP.; DA. 1977; VOL. 26; NO 3; PP. 213-214; BIBL. 3 REF.Article

ON THE ELECTRIC FIELD DISTRIBUTION WITHIN THE FIELD ION MICROSCOPE AND NEAR THE SURFACE OF FIELD EMITTERSGIPSON GS; YANNITELL DW; EATON HC et al.1979; J. PHYS. D; GBR; DA. 1979; VOL. 12; NO 7; PP. 987-996; BIBL. 18 REF.Article

THE IMAGING PROCESS IN FIELD ION MICROSCOPY FROM THE FEM TO THE ATOM-PROBE.MULLER EW.1976; C.R.C. CRIT. REV. SOLID STATE SCI.; U.S.A.; DA. 1976; VOL. 6; NO 2; PP. 85-109; BIBL. 2 P. 1/2Article

DEVELOPMENT OF A FIELD EMISSION ELECTRON MICROSCOPETONOMURA A; MATSUDA T; ENDO J et al.1979; J. ELECTRON MICR.; JPN; DA. 1979; VOL. 28; NO 1; PP. 1-11; BIBL. 13 REF.Article

THREE-COLOR DIRECT SUPERPOSITION FOR FIELD-ION MICROSCOPY.MELMED AJ; CARROLL JJ.1976; J. APPL. PHYS.; U.S.A.; DA. 1976; VOL. 47; NO 8; PP. 3762-3763; BIBL. 7 REF.Article

MAGNIFICATION IN THE FIELD-ION MICROSCOPEWALLS JM; SOUTHWORTH HN.1979; J. PHYS. D; GBR; DA. 1979; VOL. 12; NO 5; PP. 657-667; H.T. 1; BIBL. 11 REF.Article

BLOC D'ALIMENTATION HAUTE TENSION D'UN MICROSCOPE A EMISSION IONIQUENIKONENKOV NV.1979; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1979; PP. 140-142; BIBL. 4 REF.Article

MICROSCOPE A EMISSION DE CHAMP POUR L'ETUDE DES PROPRIETES EMISSIVES DES FACES DE MONOCRISTAUXSUVOROV AL; BOBKOV AF; KUZNETSOV B YA et al.1979; PRIB. TEH. EKSP.; ISSN 0032-8162; SUN; DA. 1979; NO 4; PP. 248-250; BIBL. 11 REF.Article

THE INFLUENCE OF BEAM INTENSITY ON THE CONTRAST TRANSFER FUNCTION OF A FIELD EMISSION ELECTRON MICROSCOPETROYON M.1979; OPTIK; DEU; DA. 1979; VOL. 52; NO 5; PP. 401-411; ABS. GER; BIBL. 36 REF.Article

MAGNETIC SECTOR ATOM-PROBE FIELD ION MICROSCOPY WITH A RETARDING POTENTIAL ANALYZERCULBERTSON RJ; SAKURAI T.1978; J. VACUUM SCI. TECHNOL.; USA; DA. 1978; VOL. 15; NO 5; PP. 1752-1755; BIBL. 14 REF.Article

A SPECIMEN-EXCHANGE DEVICE FOR AN ULTRA-HIGH VACUUM ATOM-PROBE FIELD-ION MICROSCOPEWAGNER A; HALL TM; SEIDMAN DN et al.1978; VACUUM; GBR; DA. 1978; VOL. 28; NO 12; PP. 543-545; BIBL. 15 REF.Conference Paper

TEMPERATURE MEASUREMENTS IN FIELD EMISSION MICROSCOPY. I. A TUNGSTEN RESISTANCE TEMPERATURE SCALE.WORKOWSKI CJ.1977; J. PHYS. E; G.B.; DA. 1977; VOL. 10; NO 5; PP. 538-543; BIBL. 44 REF.Article

INTERNATIONAL FIELD EMISSION SYMPOSIUM. 23. ABSTRACTS; UNIVERSITY PARK, PA.; 1976.sd; S.L.; DA. S.D.; PP. (66P.); BIBL. DISSEM.Conference Paper

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